Atomic Structure
Equipment: | Institution: | Description: |
---|---|---|
PANalytical X'Pert Pro powder diffractometer Powder XRD | University of Strathclyde | X-Ray diffraction of powder samples to obtain crystal strcuture. |
Electrical Properties
Equipment: | Institution: | Description: |
---|---|---|
Electrochemical Impedance Spectroscopy | University of Edinburgh | Analysis of a sample’s response to the application of a small ac signal. Characterisation of electrode processes and complex interfaces. |
Cyclic and differential pulse voltammetry | University of Edinburgh | Investigate the electrochemical properties of an analyte in solution. |
Spectroelectrochemistry | University of Edinburgh | Provides spectroscopic analysis of electrgenerated compounds, including electronic absorption, light emission and scattering, and magnetic resonance. |
4-Point Probe | Heriot-Watt University | Resistivity measurements for semiconducting and conducting samples. |
Keithly 4200 semiconductor analyser | University of Strathclyde | Electronic characterisation of organic photovoltaics. |
Ivium Potentiostat | University of the West of Scotland | Electrochemical measurements and electrical impedance spectroscopy. |
Voltlab 40 Potentiostat | University of the West of Scotland | Electrochemical measurements and electrical impedance spectroscopy . |
Four Point Probe Station | University of the West of Scotland | Sheet resistance measurements of tin films. |
Network Analyser | University of the West of Scotland | Measure piezoelectric device performance. |
Laser vibrometer | University of the West of Scotland | Measure piezoelectric device performance. |
Impedance Analyser | University of the West of Scotland | Measure piezoelectric device performance. |
Electrical Probe Station | University of the West of Scotland | Electrical device measurement. |
Morphological Analysis
Equipment: | Institution: | Description: |
---|---|---|
Atomic Force Microscope (AFM) | University of St Andrews | High resolution force microscope for morphological studies. |
Profilometer | University of St Andrews | Thickness measurements >20 nm. |
Hysitron Atomic Force Microscope/Nanoindentation | University of the West of Scotland | High resolution imaging of surface features, hardness and young's modulus measurements ion ting films. |
Leica/Nion Optical Microscopes | University of the West of Scotland | Optical microsocopy and Nomarski microscopy. |
Structural Properties
Equipment: | Institution: | Description: |
---|---|---|
Mecmesin Adhesion Tester | University of the West of Scotland | Analyse adhesion of thin films to substrates. |
MX303 Wafer Geometry | University of the West of Scotland | Stress measurements in thin films. |
Wear Tester | University of the West of Scotland | Wear testing of coatings. |
Impact Tester | University of the West of Scotland | Impact testing of coatings. |
Other Electronic and Materials Characterisation
Equipment: | Institution: | Description: |
---|---|---|
Electron Paramagnetic Resonance | University of Edinburgh | Excitation of electron spins to study materials with unpaired electrons, with high analytical specificity. |
GouchHouse&Go 750-D automatic spectro-radiometric measurement | University of Strathclyde | Custom built spectrophotometer for characterisation of light sensing detectors, efficiency measurements based on input light. Output can be scatter light, transmitted light or photocurrent. |
SC Technology Plasma emission spectrometer | University of the West of Scotland | High resolution optical emission monitor |
Scientific Syste,s Smarprobe Langmuir Probe | University of the West of Scotland | Ion density, electron density, electron temperature measurements. |
CCR Technology CEA4 Faraday Cup | University of the West of Scotland | Ion current density, ion energy measurements. |
MKS HPQ2 RGA | University of the West of Scotland | Mass spectrometer for measuring residual gas composition in a vacuum chamber. |
FLIR infrared camera | University of the West of Scotland | Remote temperature measurement and mapping. |