Excitation Sources
| Equipment: | Institution: | Description: |
|---|---|---|
| Fianium Supercontinuum Laser | Heriot-Watt University | Broadband emission over the range 400 - 2,600 nm. Power rating of 6 W between 400 - 1700 nm. 80-0.1 MHz rep. rate. |
| Fianium Acusto Optical Tunable Filter | Heriot-Watt University | Modulate wavelength and amplitude from laser power source. |
| ORIEL QTH Lamp and Voltage Controller | Heriot-Watt University | Broadband excitation of saples. Near columnated wide beam broadband emission over the range 300 - 2,400 nm. 1000 W. |
| ELFORLIGHT 1064 nm CW Laser | Heriot-Watt University | Sample excitation at 1064 nm. |
| HP Tunable Laser | Heriot-Watt University | Excitation of samples in the near infrared. Tunable CW laser over wavelength range 1450 - 1590 nm. 9.9 mW. |
| Mellis Griot HeNe Laser (x3) | Heriot-Watt University | Sample excitation at 632.8 nm, in addition to optical system alignment. 10 mW. |
| Spectra Physics Ar-Kr multiwavelength laser | Heriot-Watt University | Sample excitation over the range 350 - 676 nm. |
| HeCd Laser | Heriot-Watt University | 325 nm wavelength multimode laser. Suitable for sample excitation and lithographic techniques. 10 mW. |
| Ultrafast laser amplifier facility | University of St Andrews | Time resolved photophysics (absorption and PL) in the 100 fs - 2 ns time domain. |
Ellipsometry
| Equipment: | Institution: | Description: |
|---|---|---|
| Woollam VB-400 Elipsometer | Heriot-Watt University | Reflection (R) and transmission (T) elipsometery and intensity, generalized elipsometery, cross polarized R and T, depolarisation, scatterometry and Mueller-matrix, 193 - 2,500 nm range. Determine film thickness and optical constants of a material. |
| JA Woollam VASE spectroscopic ellipsometer | University of St Andrews | Reflection (R) and transmission (T) elipsometry and intensity, generalized elipsometry, cross polarized R and T, depolarisation, scatterometry and Mueller matrix. 193 - 2,500 nm range. Determine film thickness and optical constants of a material. |
| Horiba UVISEL Ellipsometry | University of the West of Scotland | Refractive index, extinction coefficient and thickness of thin films 190 - 2,200 nm. |
Photon Detection and Analysis
| Equipment: | Institution: | Description: |
|---|---|---|
| UV/VIS/NearIR Spectrophotometer | University of Edinburgh | Transmission, absorption and emission characterisation of solid and liquid sasmples. |
| Perkin Elmer Lambda 950 UV-VIS Spectrophotoemeter | Heriot-Watt University | Transmission, reflection, absorption and emission characterisation of oslid and liquid samples. Additional 150 nm integrating sphere. 250 - 3,300 nm. |
| Edinburgh Instrucments FS920 Spectrofluorometer | Heriot-Watt University | Measure luminescence spectra with single photon counting sensitivity. Xenon lamp (450 W, <1200 nm), or Supercontinuum Laser for excitation. Steady-state detection over the range 200 nm - 2100 nm. Integrating sphere for PLQY analysis of solids and liquids. |
| Ocean Optics HR2000 High Resolution Fibre Spectrometer | Heriot-Watt University | Analyse sample emission over a wavelength range with 0.065 resolution (FWHM). System responsive over 200 - 1100 nm range. USB connection. |
| Cary UV/VIS spectrophotometer | University of St Andrews | Can carry out reflection, transmission and absorption measurements. 190 - 850 nm spectral range. |
| Gilden Fluoresens fluorometer | University of St Andrews | Obtain photoluminescence spectra. |
| Optical cryostats (liquid nitrogen and helium) | University of St Andrews | Optical studies at low temperatures. |
| Hamatsu C9920-02 Absolute PLQY | University of St Andrews | Photoluminescence quantum yield measurements of films, powders and solutions. |
| Time correlated single photon counting TCSPC | University of St Andrews | Time resolved PL in the picosecond to millisecond domian. To understand charge transfer states and recombination. |
| Aquila Spectrophoometer | University of the West of Scotland | Measures reflectance and transmittance at variable angles to obtain refractive index, extinction coefficient and thickness of thin films 350 - 1,700 nm. |
| Hitachi UV/VIS/IR SpectrometerSurface | University of the West of Scotland | Transmission of thin films from 190 - 3,200 nm. |
| Filmetrics Reflectance System | University of the West of Scotland | Visible-NIR reflection measurements. |
| VEECO DWDM Mapper | University of the West of Scotland | Maps DWDM filter peak position over wafer surface with picometer resolution tunable laser. |
| Photonetics Optical Multichannel Analyser | University of the West of Scotland | High resolution spectral analyser for 1,400 - 1,600 nm. |